Published in Chemistry World, 27 Aug 2015
Researchers in Germany and the Czech Republic have improved the clarity of atomic force microscopy (AFM) to probe the distribution of charges within atoms and molecules. The new ability could help in the design of solar cells, by unmasking the generation of charge carriers and how they hop to and from electrodes.
Normal AFM relies on the dynamics of a tiny oscillating cantilever, which is scanned over a surface under study. By monitoring the resonant frequency of the cantilever, a scientist can determine, with nanometer resolution, the shape and makeup of any surface features. […]
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